We'll email you when they publish, award or win · Free · No card
This contract opportunity involves the procurement of systems designed for the characterization of crystallographic quality and defectivity in semiconductors. The project is divided into two lots: Lot 1 includes an X-ray diffractometer (CIG B2EB2EE6C8), and Lot 2 includes a spectrometer (CIG B2EB2EF
